Chemical force microscopy for hot-embossing lithography release layer characterization

Neil S Cameron1, Arnaud Ott1, Hélène Roberge1

  • 1Industrial Materials Institute: National Research Council Canada, 75 Blvd. de Mortagne, Boucherville, Québec, J4B 6Y4, Canada. neil.cameron@cnrc.gc.ca.

Soft Matter
|July 19, 2020
PubMed
Summary

Variable temperature chemical force microscopy modeled hot-embossing interactions between polymer surfaces and specialized tips. This study investigated how temperature affects the adhesion and friction forces at the interface.

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