Dual-energy crystal-analyzer scheme for spectral tomography

Denis Zolotov1, Alexey Buzmakov1, Maxim Grigoriev2

  • 1Shubnikov Institute of Crystallography, Federal Scientific Research Centre 'Crystallography and Photonics' RAS, Leninsky prospekt 59, Moscow, 119333, Russian Federation.

Journal of Applied Crystallography
|July 21, 2020
PubMed
Summary

This study introduces a novel method for crystal analyzer adjustment to separate X-ray characteristic lines. This enables simultaneous tomographic projection registration, advancing X-ray imaging techniques.

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