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Demodulation Method of F-P Sensor Based on Wavelet Transform and Polarization Low Coherence Interferometry
Jiwen Cui1,2, Yizhao Niu1,2, Hong Dang1,2
1Center of Ultra-precision Optoelectronic Instrument, Harbin Institute of Technology, Harbin 150080, China.
Sensors (Basel, Switzerland)
|August 6, 2020
Summary
This study introduces a wavelet-based method for processing polarized low-coherence interferometry (PLCI) data from Fabry-Perot (F-P) sensors. The technique enhances accuracy by denoising signals and precisely locating fringe envelopes for improved demodulation.
Area of Science:
- Optical Metrology
- Sensor Technology
- Signal Processing
Background:
- Polarized low-coherence interferometry (PLCI) is a key technique for demodulating Fabry-Perot (F-P) sensors.
- Conventional methods are susceptible to noise and dispersion, affecting interference fringe analysis.
- Accurate demodulation is crucial for precise F-P sensor measurements.
Purpose of the Study:
- To develop an advanced data processing method for PLCI to improve Fabry-Perot sensor demodulation.
- To mitigate the impact of noise and dispersion on interference fringe data.
- To achieve higher accuracy and resolution in F-P cavity length measurements.
Main Methods:
- Application of wavelet tools for extracting information from fringe extremum locations and envelope centers.
- Wavelet threshold denoising (WTD) algorithm to eliminate electrical noise.
- Complex Morlet wavelet for fringe envelope extraction, followed by precise extremum location tracking for demodulation.
Main Results:
- The proposed method successfully extracts fringe envelopes and predicts extremum locations.
- Accurate demodulation of an air Fabry-Perot cavity (length 17–20 μm) was achieved.
- Experimental results demonstrated a repeatability accuracy better than 6.04 nm and a resolution below 4.0 nm.
Conclusions:
- The wavelet-based data processing method offers a robust approach for PLCI demodulation of F-P sensors.
- The technique effectively overcomes noise and dispersion challenges, enhancing measurement precision.
- This method significantly improves the accuracy and resolution of F-P sensor characterization.

