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X-ray phase-sensitive imaging using a bilens interferometer based on refractive optics.

D Zverev, I Snigireva, V Kohn

|August 6, 2020

Summary

This summary is machine-generated.

A novel phase-sensitive X-ray imaging technique using a bilens interferometer was developed. This method achieves high-resolution phase shift profiling of samples, validated by experiments with X-rays.

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Area of Science:

Physics
Materials Science
Optics

Background:

Phase-sensitive X-ray imaging offers advanced material characterization.
Interferometric techniques are crucial for high-resolution measurements.
Bilens interferometers provide a unique setup for phase retrieval.

Purpose of the Study:

To develop and validate a phase-sensitive X-ray imaging technique using a bilens interferometer.
To achieve high phase and spatial resolution in sample profiling.
To demonstrate the technique's applicability with experimental data.

Main Methods:

A bilens interferometer setup was employed for X-ray imaging.
Sample scanning across one lens of the interferometer was performed.
Interference pattern changes were recorded using a high-resolution detector.

Main Results:

The technique successfully acquired the absolute value of a phase shift profile.
Experimental results with fiber samples were consistent with theoretical models and simulations.
High phase and spatial resolution were achieved.

Conclusions:

The developed bilens interferometer-based X-ray imaging technique is effective for phase shift profiling.
The method shows promise for various applications in materials science and beyond.
Further improvements and applications are anticipated.