Fast low-noise transimpedance amplifier for scanning tunneling microscopy and beyond

Martin Štubian1, Juraj Bobek1, Martin Setvin1

  • 1Institute of Applied Physics, TU Wien, 1040 Vienna, Austria.

Summary

A new transimpedance amplifier offers low noise and wide dynamic range for scanning tunneling microscopy (STM). It minimizes capacitance and noise, making it ideal for low-temperature STM and other applications.

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