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Updated: Dec 13, 2025

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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
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Fast low-noise transimpedance amplifier for scanning tunneling microscopy and beyond
Martin Štubian1, Juraj Bobek1, Martin Setvin1
1Institute of Applied Physics, TU Wien, 1040 Vienna, Austria.
The Review of Scientific Instruments
|August 6, 2020
Summary
A new transimpedance amplifier offers low noise and wide dynamic range for scanning tunneling microscopy (STM). It minimizes capacitance and noise, making it ideal for low-temperature STM and other applications.
Area of Science:
- Instrumentation and Measurement
- Materials Science and Engineering
Background:
- Scanning Tunneling Microscopy (STM) requires sensitive current amplifiers.
- Low-noise, wide dynamic range amplifiers are crucial for advanced STM applications.
Purpose of the Study:
- To design and characterize a novel transimpedance amplifier for STM.
- To address noise limitations and enhance performance in low-current measurements.
Main Methods:
- Design of a transimpedance amplifier with a 1 GΩ feedback resistor.
- Characterization of noise, bandwidth (50 kHz at 35 pF), and dynamic range (0.1 pA-50 nA).
- Analysis of noise sources, including operational amplifier input impedance effects.
Main Results:
- The amplifier achieves low noise, dominated by Johnson noise at low currents.
- Sufficient bandwidth (50 kHz) for typical STM operation.
- Wide dynamic range (0.1 pA-50 nA) without requiring range switching.
Conclusions:
- The designed transimpedance amplifier is well-suited for low-temperature STM applications.
- It offers significant advantages in noise reduction and dynamic range.
- Potential applications extend to scanning electron microscopy and photodiode amplification.
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