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Updated: Dec 13, 2025

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
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Fast low-noise transimpedance amplifier for scanning tunneling microscopy and beyond

Martin Štubian1, Juraj Bobek1, Martin Setvin1

  • 1Institute of Applied Physics, TU Wien, 1040 Vienna, Austria.

The Review of Scientific Instruments
|August 6, 2020
PubMed

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