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X-ray Crystallography

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...

$X-ray Diffraction of Biological Samples$ 01:10

X-ray Diffraction of Biological Samples

X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are scattered by the electron clouds around the sample atoms. The X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal...

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Related Experiment Video

Updated: Dec 12, 2025

$Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples$

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

A new parafocusing paradigm for X-ray diffraction.

Danae Prokopiou¹, James McGovern¹, Gareth Davies¹

¹Cranfield Forensic Institute, Cranfield University, Shrivenham SN6 8LA, UK.

Journal of Applied Crystallography

|August 14, 2020

Summary

A novel X-ray diffraction method uses an annular beam and elliptical sample path for enhanced intensity. This technique eliminates the need for flat-specimen approximations, improving X-ray diffraction measurements.

Keywords:

Bragg–Brentano geometry conical incident beams focal construct geometry powder X-ray diffraction

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Area of Science:

Materials Science
Crystallography
Analytical Chemistry

Background:

Conventional X-ray diffraction (XRD) methods often rely on approximations like the flat-specimen assumption.
Achieving high intensity maxima for precise measurements can be challenging with standard setups.

Purpose of the Study:

To introduce and validate a new parafocusing X-ray diffraction approach using an annular incident beam.
To demonstrate the feasibility of measuring high intensity maxima without the flat-specimen approximation.

Main Methods:

Implementation of an annular incident beam for X-ray diffraction.
Utilization of an elliptical specimen path on a flat sample.
Comparison of angular- and energy-dispersive measurement modes.
Validation through theoretical framework, simulations, and experimental data.

Main Results:

The new method successfully produces relatively high intensity maxima.
The flat-specimen approximation is not required, broadening applicability.
Scattering signatures were effectively measured and compared to conventional pencil-beam arrangements.

Conclusions:

The demonstrated parafocusing X-ray diffraction technique offers a promising alternative to conventional methods.
This approach enhances measurement intensity and removes geometric constraints, advancing X-ray diffraction capabilities.