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Updated: Dec 11, 2025

Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography
Published on: October 25, 2021
Jiansheng Guo1, Guan Wang2, Wen Tang3
1Department of Pathology of Sir Run Run Shaw Hospital, Zhejiang University School of Medicine, 310058 Hangzhou, Zhejiang, China; Center of Cryo-Electron Microscopy, Zhejiang University School of Medicine, 310058 Hangzhou, Zhejiang, China.
Focused ion beam scanning electron microscopy (FIB-SEM) offers 3D nanoscale imaging. This study optimized cryofixation and freeze-substitution protocols, enhancing image quality for detailed cellular substructure analysis.
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