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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

Updated: Dec 11, 2025

Measuring the Interaction Force Between a Droplet and a Super-hydrophobic Substrate by the Optical Lever Method

Measuring the Interaction Force Between a Droplet and a Super-hydrophobic Substrate by the Optical Lever Method

Published on: June 14, 2019

Quantifying Surface Wetting Properties Using Droplet Probe Atomic Force Microscopy.

Dan Daniel¹, Yunita Florida¹, Chee Leng Lay¹

¹Institute of Materials Research and Engineering, A*STAR (Agency for Science, Technology and Research), 2 Fusionopolis Way, Innovis, 138634 Singapore.

ACS Applied Materials & Interfaces

|August 18, 2020

Summary

This summary is machine-generated.

This study introduces a new atomic force microscopy method to measure surface wettability. This technique precisely quantifies droplet-surface interactions, enabling detailed mapping of surface properties.

Keywords:

atomic force microscopy droplet polyzwitterionic brushes superhydrophobic superoleophobic surfaces wetting

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Last Updated: Dec 11, 2025

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Published on: June 14, 2019

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Quantitative and Qualitative Examination of Particle-particle Interactions Using Colloidal Probe Nanoscopy

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Published on: July 18, 2014

Area of Science:

Surface science
Materials science
Nanotechnology

Background:

Surface wettability dictates functional properties like anti-fogging and anti-fouling.
Contact angle measurements are standard for wettability but limited for microscale droplets and heterogeneity analysis.
Macroscopic wetting properties are well-described, but microscale phenomena remain challenging.

Purpose of the Study:

To develop a novel method for quantitatively measuring surface wettability at the microscale.
To overcome the limitations of traditional contact angle measurements for small droplets and heterogeneous surfaces.
To enable high-resolution mapping of surface properties relevant to fouling and functional performance.

Main Methods:

Utilized atomic force microscopy (AFM) to measure interaction forces between a microdroplet and a surface.
Achieved piconewton force resolution for quantitative interaction force measurements.
Developed a technique for spatially mapping surface characteristics with micron resolution.

Main Results:

Demonstrated the ability to quantitatively measure microdroplet-surface interaction forces.
Successfully mapped topographical and chemical heterogeneities on surfaces with micron resolution.
Provided a new tool for understanding microscale wetting phenomena.

Conclusions:

The developed AFM technique offers a powerful alternative to contact angle measurements for microscale wettability.
This method allows for detailed characterization of surface properties, crucial for anti-fouling and anti-fogging applications.
Spatially resolved force measurements provide insights into factors influencing surface fouling and performance.