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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

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Atomic Force Microscopy Based Top-Illumination Electrochemical Tip-Enhanced Raman Spectroscopy.

Yi-Fan Bao¹, Mao-Feng Cao¹, Si-Si Wu¹

¹State Key Laboratory of Physical Chemistry of Solid Surfaces, Collaborative Innovation Center of Chemistry for Energy Materials (iChEM), College of Chemistry and Chemical Engineering, Xiamen University, Xiamen 361005, China.

Analytical Chemistry

|August 18, 2020

Summary

A new top-illumination atomic force microscopy (AFM) based electrochemical tip-enhanced Raman spectroscopy (EC-TERS) technique enhances in situ analysis of electrochemical interfaces. This method improves sensitivity and efficiency for opaque samples, advancing energy storage and catalysis research.

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Area of Science:

Nanotechnology
Analytical Chemistry
Electrochemistry

Background:

Electrochemical tip-enhanced Raman spectroscopy (EC-TERS) enables nanoscale study of solid/liquid interfaces.
Existing EC-TERS methods have limitations in sample type and operational window.

Purpose of the Study:

Develop a top-illumination AFM-based EC-TERS technique.
Extend EC-TERS applications to opaque samples and broaden its potential window.
Enhance detection sensitivity and experimental efficiency.

Main Methods:

Utilized a top-illumination atomic force microscopy (AFM) setup with a high numerical aperture water-immersion objective.
Coated AFM-TERS tips with a SiO2 protection layer for enhanced stability in liquid.
Investigated tip-sample distance effects on TERS enhancement in liquid.
Evaluated the technique using the electrochemical redox reaction of polyaniline.

Main Results:

Successfully developed and implemented a top-illumination EC-AFM-TERS technique.
Achieved high detection sensitivity and experimental efficiency.
Demonstrated the technique's reliability through polyaniline redox reaction analysis.
Confirmed improved mechanical and chemical stability of SiO2-coated tips.

Conclusions:

The developed top-illumination EC-AFM-TERS technique broadens EC-TERS applicability.
This technique is promising for studying practical systems like energy storage and (photo)electrocatalysis.
Offers enhanced capabilities for in situ nanoscale analysis of electrochemical interfaces.