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Updated: Dec 11, 2025

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
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Atomic Layer MoS2Te2(1- Ternary Alloys: Two-Dimensional van der Waals Growth, Band gap Engineering, and Electrical

DongHwan Kim1, Guen Hyung Oh2, Ansoon Kim1

  • 1Materials and Convergence Metrology Institute, Korea Research Institute of Standards and Science, Daejeon 34113, South Korea.

ACS Applied Materials & Interfaces
|August 19, 2020
PubMed

Keywords:
MoSTefield-effect transistormetal−organic chemical vapor depositionternary alloywafer-scale synthesis

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