Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

4.2K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
4.2K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Tryptamine Terminated Low-Dimensional Interfaces Enabled High Performance Perovskite/Silicon Tandem Solar Cells.

Advanced materials (Deerfield Beach, Fla.)·2026
Same author

Toward accurate predictions of bond-selective fluorescence spectra.

The Journal of chemical physics·2026
Same author

Unraveling UV Stability in Metal Halide Perovskites: From Degradation Mechanisms to Molecular Passivation.

The journal of physical chemistry letters·2026
Same author

Far-field single-molecule vibrational spectroscopy and imaging.

Chemical science·2026
Same author

Homogenized Optoelectronic Properties in Perovskites: Achieving High-Efficiency Solar Cells with Common Chloride Additives.

Journal of the American Chemical Society·2026
Same author

Heterodimensional Epitaxy of CsSnI<sub>3</sub> Microcrystalline Cubes for Bright and Efficient Near-Infrared Light-Emitting Diode.

Advanced materials (Deerfield Beach, Fla.)·2025

Related Experiment Video

Updated: Dec 11, 2025

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
14:13

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Published on: October 24, 2014

12.0K

Peak force visible microscopy.

Haomin Wang1, Le Wang1, Yuequn Shang2

  • 1Department of Chemistry, Lehigh University, 6 East Packer Ave., Bethlehem, PA 18015, USA. xgx214@lehigh.edu.

Soft Matter
|August 20, 2020
PubMed
Summary

Peak Force Visible (PF-vis) microscopy achieves 3 nm resolution for optical absorption imaging of soft matter. This technique offers high sensitivity, approaching single-molecule detection, and can determine exciton diffusion ranges in organic photovoltaics.

More Related Videos

Force Spectroscopy of Single Protein Molecules Using an Atomic Force Microscope
06:45

Force Spectroscopy of Single Protein Molecules Using an Atomic Force Microscope

Published on: February 28, 2019

9.2K
Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
08:58

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

3.5K

Related Experiment Videos

Last Updated: Dec 11, 2025

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
14:13

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Published on: October 24, 2014

12.0K
Force Spectroscopy of Single Protein Molecules Using an Atomic Force Microscope
06:45

Force Spectroscopy of Single Protein Molecules Using an Atomic Force Microscope

Published on: February 28, 2019

9.2K
Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
08:58

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

3.5K

Area of Science:

  • Nanotechnology
  • Optical Microscopy
  • Materials Science

Background:

  • Conventional light microscopy is limited by the optical diffraction limit.
  • Photothermal effect with Atomic Force Microscopy (AFM) overcomes this but has limitations in resolution and sample damage.
  • Soft matter imaging requires high resolution and minimal surface disruption.

Purpose of the Study:

  • To develop a novel microscopy technique for measuring visible optical absorption in soft matter.
  • To achieve sub-diffraction limit spatial resolution and high imaging sensitivity.
  • To enable direct extraction of photophysical parameters like exciton diffusion range.

Main Methods:

  • Development of Peak Force Visible (PF-vis) microscopy.
  • Utilizing the photothermal effect with AFM in a peak force mode.
  • Finite element modeling and data analysis for parameter extraction.

Main Results:

  • Demonstrated spatial resolution of 3 nm on virus-like particles.
  • Achieved imaging sensitivity approaching single protein molecules.
  • Successfully extracted exciton diffusion ranges from organic photovoltaic polymers.

Conclusions:

  • PF-vis microscopy provides high-resolution nano-imaging of optical absorption in soft matter.
  • The technique allows for deciphering correlations between photothermal signals and photophysical parameters.
  • PF-vis microscopy offers a non-destructive method for analyzing nanoscale optical properties.