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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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On the Σ classes in E6
1Jupiterstrasse 3, CH-3015 Berne, Switzerland.
Acta Crystallographica. Section A, Foundations and Advances
|September 2, 2020
Abstract:
In E6, the cone of positive definite quadratic forms is subdivided into Σs subcones and its equivalence classes {\cal E}_{\Sigma _s} are determined for s = 0-3, and 18-21.
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