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Published on: December 15, 2023
Learning image features with fewer labels using a semi-supervised deep convolutional network
Fernando P Dos Santos1, Cemre Zor2, Josef Kittler3
1Institute of Mathematical and Computer Sciences (ICMC), University of São Paulo (USP), São Carlos/SP, 13566-590, Brazil.
Abstract:
Learning feature embeddings for pattern recognition is a relevant task for many applications. Deep learning methods such as convolutional neural networks can be employed for this assignment with different training strategies: leveraging pre-trained models as baselines; training from scratch with the target dataset; or fine-tuning from the pre-trained model. Although there are separate systems used for learning features from labelled and unlabelled data, there are few models combining all available information. Therefore, in this paper, we present a novel semi-supervised deep network training strategy that comprises a convolutional network and an autoencoder using a joint classification and reconstruction loss function. We show our network improves the learned feature embedding when including the unlabelled data in the training process. The results using the feature embedding obtained by our network achieve better classification accuracy when compared with competing methods, as well as offering good generalisation in the context of transfer learning. Furthermore, the proposed network ensemble and loss function is highly extensible and applicable in many recognition tasks.
