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Conduction Band Edge Energy Profile Probed by Hall Offset Voltage in InGaZnO Thin Films

Hyo-Jun Joo1, Dae-Hwan Kim1, Hyun-Seok Cha1

  • 1School of Electrical and Electronics Engineering, Chung-Ang University, Seoul 06974, Korea.

Micromachines
|September 3, 2020
PubMed

Keywords:
Hall offset voltageconduction band edge energy profilen-channel InGaZnO (IGZO)percolation conduction

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