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Charge-separated spectra of suprathermal highly charged bismuth ions in a dual laser-produced plasma soft x-ray
Hiromu Kawasaki1, Toshiki Tamura1, Atsushi Sunahara2
1Department of Electrical and Electronic Engineering, Faculty of Engineering, Utsunomiya University, 7-1-2 Yoto, Utsunomiya, Tochigi 321-8585, Japan.
Abstract:
We investigated the charge-separated spectra of highly charged suprathermal bismuth (Bi) ions from a dual laser-produced plasma soft x-ray source developed for soft x-ray microscopy. The charge distribution of these suprathermal ions emitted from a solid planar Bi target was measured by an electrostatic energy analyzer. The maximum ionic charge state was observed to be Z = 17 and to possess a maximum energy of about 200 keV. This evaluation provides important information essential for the development of debris mitigation schemes in a soft x-ray microscope.
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