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Random two-frame interferometry based on deep learning.

Ziqiang Li, Xinyang Li, Rongguang Liang

    Optics Express
    |September 10, 2020
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    Summary
    This summary is machine-generated.

    This study introduces a deep learning method for accurate wavefront reconstruction from two interferograms, even with unknown phase steps. The novel approach offers improved performance over existing two-frame techniques.

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    Area of Science:

    • Optics and Photonics
    • Artificial Intelligence
    • Wavefront Sensing

    Background:

    • Phase-shifting interferometry (PSI) is crucial for precise wavefront measurement.
    • Traditional PSI methods often require multiple frames and known phase steps.
    • Accurate wavefront reconstruction from limited interferograms remains a challenge.

    Purpose of the Study:

    • To develop a robust two-frame phase-shifting interferometric wavefront reconstruction method using deep learning.
    • To enable accurate phase calculation from two interferograms with unknown and arbitrary phase steps.
    • To improve the performance and flexibility of wavefront reconstruction techniques.

    Main Methods:

    • A deep learning model trained on extensive simulation data derived from a physical model.
    • Utilizing two interferograms with an unknown phase step for wavefront reconstruction.
    • Employing a simple normalization preprocessing step, eliminating the need for DC term subtraction.

    Main Results:

    • The proposed deep learning method accurately reconstructs the wrapped phase from two interferograms.
    • The method accommodates unknown phase steps (excluding multiples of π) and flexible interferogram sizes.
    • Simulations and experiments demonstrate superior performance compared to existing two-frame methods.

    Conclusions:

    • The deep learning-based two-frame method provides an accurate and efficient solution for wavefront reconstruction.
    • This approach simplifies the interferometric process by handling unknown phase steps and reducing preprocessing requirements.
    • The method shows significant potential for advancing optical metrology and imaging applications.