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Monolayer Contact Doping of Silicon Surfaces and Nanowires Using Organophosphorus Compounds
Published on: December 2, 2013
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Perovskite Core-Shell Nanowire Transistors: Interfacial Transfer Doping and Surface Passivation
You Meng, Zhengxun Lai, Fangzhou Li
1Shenzhen Research Institute, City University of Hong Kong, Shenzhen 518057, P. R. China.
ACS Nano
|September 10, 2020
Summary
Surface doping of cesium lead bromide perovskite nanowires with molybdenum trioxide significantly enhances charge transport and stability. This breakthrough offers a promising path for high-performance, air-stable perovskite electronic devices.
Area of Science:
- Materials Science
- Nanoscience
- Electronics
Background:
- Halide perovskite electronics face limitations in charge transport and stability.
- Cesium lead bromide (CsPbBr3) nanowires (NWs) are promising but require improved performance.
- Existing methods struggle to overcome inherent material weaknesses.
Purpose of the Study:
- To achieve effective surface charge transfer doping of CsPbBr3 NWs.
- To enhance the charge transport properties and stability of perovskite nanowire devices.
- To investigate the impact of molybdenum trioxide (MoO3) surface functionalization.
Main Methods:
- Vapor-liquid-solid (VLS) growth of single-crystalline CsPbBr3 NWs.
- Surface functionalization of CsPbBr3 NWs with a 10 nm MoO3 shell.
- Fabrication of NW devices for electrical and photodetection measurements.
Main Results:
- Achieved a 15× increase in field-effect hole mobility (μh) from 1.5 to 23.3 cm2/(V s).
- Demonstrated superior responsivity (R) up to 2.36 × 10^3 A/W and EQE over 5.48 × 10^5% for photodetection.
- MoOx shell provided surface passivation, enhancing air stability by minimizing water and oxygen diffusion.
Conclusions:
- Surface doping via MoO3 functionalization is an enabling technology for low-dimensional halide perovskites.
- High-mobility and air-stable perovskite field-effect transistors (FETs) and photodetectors are realized.
- This approach overcomes critical limitations in charge transport and device longevity.
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