Related Experiment Video
Updated: Dec 9, 2025

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
Published on: April 1, 2017
Anomalous KCl(001) Surface Corrugation from Fast He Diffraction at Very Grazing Incidence
G A Bocan1, H Breiss2, S Szilasi2
1Instituto de Nanociencia y Nanotecnología, Nodo Bariloche (CONICET-CNEA) and Instituto Balseiro (U. N. Cuyo), Centro Atómico Bariloche, Avenida Bustillo 9500, 8400 San Carlos de Bariloche, Argentina.
Abstract:
We present theoretical and experimental evidence of an anomalous surface corrugation behavior in He-KCl(001) for incidence along ⟨110⟩. When the He normal energy decreases below 100 meV, i.e., He-surface distances Z>2 Å, the corrugation unexpectedly increases up to an impressive ≳85%. This is not due to van der Waals interactions but to the combination of soft potential effects and the evolution of He-cation and He-anion interactions with Z. This feature, not previously analyzed on alkali-halide surfaces, may favor the alignment properties of weakly interacting overlayers.
More Related Videos
11:14Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
08:44Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene
Published on: August 22, 2017
Related Concept Videos
Interference and Diffraction
X-ray Crystallography
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
X-ray Diffraction of Biological Samples
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are scattered by the electron clouds around the sample atoms. The X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal...
Atomic Force Microscopy
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...