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CMOS Depth Image Sensor with Offset Pixel Aperture Using a Back-Side Illumination Structure for Improving Disparity
Jimin Lee1, Sang-Hwan Kim1, Hyeunwoo Kwen1
1School of Electronics Engineering, Kyungpook National University, 80 Deahak-ro, Buk-gu, Daegu 41566, Korea.
This study enhances CMOS depth image sensors using offset pixel apertures (OPA) and back-side illumination (BSI) for improved disparity. BSI structures demonstrate superior performance over front-side illumination (FSI) for depth sensing applications.
Area of Science:
- Optoelectronics
- Computer Vision
- Semiconductor Devices
Background:
- Depth image sensors are crucial for 3D imaging and spatial awareness.
- Offset Pixel Aperture (OPA) technology enables depth sensing using a single image sensor.
- Disparity, a key metric in OPA-based depth sensing, is influenced by sensor architecture.
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