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Updated: Dec 9, 2025

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
Published on: April 13, 2016
André Bieberle1, Dominic Windisch1,2, Kerolos Iskander1
1Helmholtz-Zentrum Dresden-Rossendorf, Bautzner Landstraße 400, 01328 Dresden, Germany.
A new smart detector design for multi-plane ultrafast electron beam X-ray computed tomography (CT) reduces complexity and cost. This innovative design offers excellent performance for advanced X-ray imaging applications.
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