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Updated: Jul 24, 2026

Analysis of Contact Interfaces for Single GaN Nanowire Devices
Published on: November 15, 2013
Modeling the dynamics of interface morphology and crystal phase change in self-catalyzed GaAs nanowires
D P Wilson1,2, A S Sokolovskii2, R R LaPierre1,2
1Department of Engineering Physics, Centre for Emerging Device Technologies, McMaster University, Hamilton ON L8S 4L7, Canada.
Abstract:
The droplet contact angle and morphology of the growth interface (vertical, tapered or truncated facets) are known to affect the zincblende (ZB) or wurtzite (WZ) crystal phase of III-V nanowires (NWs) grown by the vapor-liquid-solid method. Here, we present a model which describes the dynamics of the morphological evolution in self-catalyzed III-V NWs in terms of the time-dependent (or length-dependent) contact angle or top nanowire radius under varying material fluxes. The model fits quite well the contact angle dynamics obtained by in situ growth monitoring of self-catalyzed GaAs NWs in a transmission electron microscope. These results can be used for modeling the interface dynamics and the related crystal phase switching and for obtaining ZB-WZ heterostructures in III-V.
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