Modified inverted selective plane illumination microscopy for sub-micrometer imaging resolution in

Tienan Xu1, Yean Jin Lim2, Yujie Zheng1

  • 1Research School of Electrical, Energy and Materials Engineering, College of Engineering and Computer Science, The Australian National University, Canberra, ACT 2601, Australia. steve.lee@anu.edu.au.

Lab on a Chip
|September 17, 2020
PubMed

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