Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

4.0K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
4.0K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same authorSame journal

He<sup>+</sup> FIBID-fabricated 3D AFM tip architectures: an exploratory study of hollow pillars, helices, and spirals.

Beilstein journal of nanotechnology·2026
Same author

Fabrication of ultra-small bimorph cantilevers for high-speed AFM of biological samples.

Nanotechnology·2026
Same author

A Comprehensive Analysis of Combined AFM/SEM Systems for In-Situ Nanoscale Characterizations and Multiparametric Correlative Microscopy.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2025
Same author

Deep-Learning-Assisted SICM for Enhanced Real-Time Imaging of Nanoscale Biological Dynamics.

Small methods·2025
Same author

Interfacial Self-Assembly of Sugars at Nanoscale Membranes Leads to Micron-Scale, Spectroscopically Ice-Like Chiral Suprastructures of Water.

Journal of the American Chemical Society·2025
Same author

Deep learning for enhancement of low-resolution and noisy scanning probe microscopy images.

Beilstein journal of nanotechnology·2025

Related Experiment Video

Updated: Dec 8, 2025

Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy
11:03

Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy

Published on: July 14, 2022

3.8K

An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization.

Santiago H Andany1, Gregor Hlawacek2, Stefan Hummel3

  • 1Laboratory for Bio- and Nano-Instrumentation, Swiss Federal Institute of Technology Lausanne (EPFL), Lausanne CH-1015, Switzerland.

Beilstein Journal of Nanotechnology
|September 21, 2020
PubMed
Summary

This study integrates atomic force microscopy (AFM) with helium ion microscopy (HIM) for advanced nanoscale analysis. This combined tool enables in situ correlative imaging and material property mapping without sample contamination.

Keywords:
atomic force microscopy (AFM)combined setupcorrelative microscopyhelium ion microscopy (HIM)self-sensing cantilevers

More Related Videos

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
08:58

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

3.5K
Functionalization of Atomic Force Microscope Cantilevers with Single-T Cells or Single-Particle for Immunological Single-Cell Force Spectroscopy
10:06

Functionalization of Atomic Force Microscope Cantilevers with Single-T Cells or Single-Particle for Immunological Single-Cell Force Spectroscopy

Published on: July 10, 2019

7.7K

Related Experiment Videos

Last Updated: Dec 8, 2025

Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy
11:03

Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy

Published on: July 14, 2022

3.8K
Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
08:58

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

3.5K
Functionalization of Atomic Force Microscope Cantilevers with Single-T Cells or Single-Particle for Immunological Single-Cell Force Spectroscopy
10:06

Functionalization of Atomic Force Microscope Cantilevers with Single-T Cells or Single-Particle for Immunological Single-Cell Force Spectroscopy

Published on: July 10, 2019

7.7K

Area of Science:

  • Materials Science
  • Nanotechnology
  • Microscopy

Background:

  • Helium Ion Microscopy (HIM) offers sub-nanometer resolution for imaging and nanomachining.
  • Atomic Force Microscopy (AFM) provides multiparametric nanoscale characterization and 3D topography.

Purpose of the Study:

  • To integrate AFM and HIM for in situ correlative nanoscale analysis.
  • To leverage the complementary strengths of both microscopy techniques.

Main Methods:

  • Integration of an atomic force microscope (AFM) system within a helium ion microscope (HIM) chamber.
  • Correlative experiments demonstrating simultaneous nanomachining and characterization capabilities.

Main Results:

  • Successful integration of AFM and HIM, enabling seamless workflow.
  • AFM provides direct 3D topography and nanomechanical mapping post-HIM modification.
  • Demonstrated feasibility of in situ correlative analysis without sample contamination.

Conclusions:

  • The combined AFM-HIM platform offers unprecedented capabilities for nanoscale research.
  • This integrated approach facilitates advanced materials modification and characterization.
  • The system enables comprehensive analysis of nanoscale structures and properties.