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Updated: Dec 8, 2025

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
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Shot Noise of a Temperature-Biased Tunnel Junction

Samuel Larocque1, Edouard Pinsolle1, Christian Lupien1

  • 1Université de Sherbrooke, Institut Quantique, Département de Physique, Sherbrooke, Québec J1K 2R1, Canada.

Physical Review Letters
|September 21, 2020
PubMed

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