Updated: Dec 8, 2025

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Mahmuda Akter Monne1, Peter Mack Grubb2, Harold Stern3
1Materials Science Engineering and Commercialization, Texas State University, San Marcos, TX 78666-4684, USA.
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