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Data analysis for characterization of IG110 and A3 by X-Ray diffraction and Raman spectroscopy.

Huali Wu1, Ruchi Gakhar2, Allen Chen3

  • 1Department of Mechanical Engineering, Virginia Polytechnic Institute and State University, Blacksburg, VA USA.

Data in Brief
|September 28, 2020
PubMed
Summary

This study details nuclear graphite characterization, comparing IG-110 and Graphite Matrix A3. It provides methods for calculating crystallite edge area and supplementary data for nuclear material research.

Keywords:
Crystallite edge areaIG110, A3Nuclear GraphiteXRD, Raman

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Area of Science:

  • Materials Science
  • Nuclear Engineering
  • Solid State Chemistry

Background:

  • Nuclear graphite is crucial for reactor components.
  • Characterizing microstructure and reactive sites is vital for safety and performance.
  • IG-110 and Graphite Matrix A3 are key materials in nuclear applications.

Purpose of the Study:

  • To provide supplementary data and detailed methods for the comparative analysis of nuclear graphite IG-110 and Graphite Matrix A3.
  • To elaborate on the calculation of crystallite edge area for nuclear graphite.
  • To summarize data reduction methods for IG-110 nuclear graphite characterization.

Main Methods:

  • X-ray Diffraction (XRD) and Raman Spectroscopy were employed.
  • Detailed calculation processes for crystallite edge area are presented.
  • Data reduction methodologies from prior literature are summarized.

Main Results:

  • Additional XRD and Raman data tables and figures are included.
  • Supplementary reduced data for IG-110 nuclear graphite is provided.
  • Raw data is available in the companion article's supplementary material.

Conclusions:

  • This article serves as a data repository and methodological guide for nuclear graphite research.
  • The provided data supports the comparative analysis of IG-110 and Graphite Matrix A3.
  • Enhanced understanding of nuclear graphite properties is facilitated.