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Data analysis for characterization of IG110 and A3 by X-Ray diffraction and Raman spectroscopy

Huali Wu1, Ruchi Gakhar2, Allen Chen3

  • 1Department of Mechanical Engineering, Virginia Polytechnic Institute and State University, Blacksburg, VA USA.

Data in Brief
|September 28, 2020
PubMed

Keywords:
Crystallite edge areaIG110, A3Nuclear GraphiteXRD, Raman

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