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Publisher's Note: "On the resolution of subsurface atomic force microscopy and its implications for subsurface

Daniele Piras1, Paul L M J van Neer1, Rutger M T Thijssen1

  • 1Netherlands Organization for Applied Scientific Research, TNO, 2628 CK Delft, The Netherlands.

The Review of Scientific Instruments
|October 2, 2020
PubMed
Abstract

No abstract available in PubMed .

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...