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Effects of Capping Layers with Different Metals on Electrical Performance and Stability of p-Channel SnO Thin-Film

Min-Gyu Shin1, Kang-Hwan Bae1, Hwan-Seok Jeong1

  • 1School of Electrical and Electronics Engineering, Chung‑Ang University, Seoul 06974, Korea.

Micromachines
|October 3, 2020
PubMed

Keywords:
SnOelectrical performance and stabilitymetal capping layerp-channel thin-film transistorwork function

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