A Standardized PMML Format for Representing Convolutional Neural Networks with Application to Defect Detection

Max Ferguson1, Yung-Tsun Tina Lee2, Anantha Narayanan3

  • 1Civil and Environmental Engineering, Stanford University, Y2E2 Building, 473 Via Ortega, Stanford, CA 94305, USA.

Smart and Sustainable Manufacturing Systems
|October 8, 2020
PubMed
Abstract