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Analysis of complex, beam-sensitive materials by transmission electron microscopy and associated techniques

Martha Ilett1, Mark S'ari1, Helen Freeman1

  • 1Leeds Electron Microscopy and Spectroscopy (LEMAS) Centre, School of Chemical and Process Engineering, Bragg Centre for Materials Research, University of Leeds, Leeds LS2 9JT, UK.

Philosophical Transactions. Series A, Mathematical, Physical, and Engineering Sciences
|October 26, 2020
PubMed
Summary

Transmission electron microscopy (TEM) enables analysis of beam-sensitive materials by managing radiation damage. Optimizing dose and employing scanning TEM (STEM) techniques are crucial for high-resolution imaging of complex systems.

Keywords:
STEMTEMbeam-sensitive materialsradiolysis

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