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Complex diffusion-based kinetics of photoluminescence in semiconductor nanoplatelets
A A Kurilovich1, V N Mantsevich, K J Stevenson
1Center for Energy Science and Technology, Skolkovo Institute of Science and Technology, 121205, Moscow, Russia.
Physical Chemistry Chemical Physics : PCCP
|October 26, 2020
Summary
We developed a simulation model to explain photoluminescence (PL) intensity in semiconductor nanoplatelets. This model reveals how exciton recombination, diffusion, and trapping influence PL emission, matching experimental data.
Area of Science:
- Materials Science
- Condensed Matter Physics
- Nanotechnology
Background:
- Semiconductor nanoplatelets exhibit unique photoluminescence (PL) properties.
- Understanding PL emission intensity dynamics is crucial for their optoelectronic applications.
Purpose of the Study:
- To develop a theoretical framework explaining the photoluminescence emission intensity in semiconductor nanoplatelets.
- To elucidate the roles of exciton dynamics, including recombination, diffusion, and trapping, in shaping PL intensity curves.
Main Methods:
- A diffusion-based simulation model was employed.
- Theoretical models were developed to analyze exciton behavior.
- The models were validated against experimental PL intensity data from various nanoplatelet systems.
Main Results:
- The interplay of exciton recombination, diffusion, and trapping accurately reproduces experimental PL intensity curves.
- Short-time emission is dominated by recombination, showing exponential decay.
- Long-time emission is governed by exciton release from surface traps, exhibiting a power-law tail.
- The transition between these regimes is controlled by exciton diffusion properties.
Conclusions:
- The proposed diffusion-based model successfully explains the complex photoluminescence intensity behavior in semiconductor nanoplatelets.
- The findings highlight the critical role of exciton diffusion and surface trapping in determining PL emission characteristics.
- This work provides a robust theoretical tool for analyzing and predicting PL properties in nanomaterials.
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