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Updated: Jul 26, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Author Correction: Longitudinal unzipping of 2D transition metal dichalcogenides
Suchithra Padmajan Sasikala1, Yashpal Singh2, Li Bing1
1National Creative Research Initiative Centre for Multi-Dimensional Directed Nanoscale Assembly, Department of Materials Science and Engineering, KAIST, Daejeon, 34141, Republic of Korea.
Abstract:
An amendment to this paper has been published and can be accessed via a link at the top of the paper.
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