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Three-dimensional nanoscale localization of point-like objects using self-interference digital holography.

Abhijit Marar1, Peter Kner1

  • 1School of Electrical and Computer Engineering, University of Georgia, Athens, Georgia 30602, USA.

Optics Letters
|October 29, 2020
PubMed
Summary
This summary is machine-generated.

We developed a new 3D imaging method using self-interference digital holography (SIDH) for precise localization of fluorescent emitters. This technique achieves nanometer precision over large volumes without refocusing, advancing single molecule localization microscopy.

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Area of Science:

  • Microscopy and Imaging
  • Optical Physics
  • Nanotechnology

Background:

  • Accurate 3D localization of fluorescent emitters is crucial for nanoscale imaging.
  • Conventional microscopy often requires refocusing for large axial range imaging.
  • Existing single molecule localization techniques offer high resolution but can be limited by axial range.

Purpose of the Study:

  • To introduce and validate a novel 3D localization method for point-like fluorescent emitters.
  • To demonstrate nanometer precision localization over large volumes using self-interference digital holography (SIDH).
  • To assess the performance of SIDH with varying photon detection counts.

Main Methods:

  • Utilizing self-interference digital holography (SIDH) for 3D imaging.
  • Applying single molecule localization principles to SIDH data.
  • Imaging fluorescent nanospheres (100 nm and 40 nm) to validate the technique.

Main Results:

  • Achieved 3D localization of fluorescent nanospheres with nanometer precision.
  • Demonstrated a lateral localization precision of 5 nm and axial precision of 40 nm with 49,000 detected photons.
  • Successfully detected nanospheres using as few as 13,000 detected photons, showcasing sensitivity.

Conclusions:

  • SIDH is a powerful technique for high-precision 3D localization of fluorescent emitters in large volumes.
  • The method overcomes the need for refocusing, simplifying imaging over extended axial ranges.
  • SIDH offers a promising approach for advanced microscopy applications requiring nanoscale resolution.