Atomic Force Microscopy (AFM) As a Surface Mapping Tool in Microorganisms Resistant Toward Antimicrobials: A...

Area of Science:

• Microbiology
• Biophysics
• Nanotechnology

Background:

• Antimicrobial resistance (AMR) is a growing global health challenge.
• Effective screening and isolation of resistant microbial strains are crucial.
• Microbial nanomechanical properties offer potential for differentiation.

Purpose of the Study:

• To review the application of Atomic Force Microscopy (AFM) in combating antimicrobial resistance.
• To explore the use of single-cell force spectroscopy (SCFS) and single-molecule force spectroscopy (SMFS) for microbial analysis.
• To identify strengths, weaknesses, and future research directions for AFM-based AMR strategies.

Main Methods:

• Utilizing the distinct nanomechanical properties of microbes (e.g., elasticity, turgor pressure, Young's modulus).
• Employing Atomic Force Microscopy (AFM) to investigate microbial surface biophysical properties.
• Measuring adhesive forces and analyzing force-distance curves using advanced AFM instruments.
• Applying single-cell force spectroscopy (SCFS) and single-molecule force spectroscopy (SMFS).

Main Results:

• AFM can effectively probe nanomechanical properties and adhesive forces of microbes.
• Force spectroscopy reveals insights into intercellular interactions and biofilm formation.
• AFM-based techniques show promise in differentiating sensitive and resistant microbial strains.
• SCFS and SMFS are emerging as powerful tools against resistant microbes.

Conclusions:

• AFM and its advanced techniques (SCFS, SMFS) offer novel approaches to study and combat antimicrobial resistance.
• Understanding microbial nanomechanics is key to developing new diagnostic and therapeutic strategies.
• Further research is needed to optimize AFM applications and address limitations in the fight against AMR.