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Related Experiment Video

Updated: Dec 2, 2025

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Focusing a round coherent beam by spatial filtering the horizontal source.

Eric M Dufresne1, Suresh Narayanan1, Ruben Reininger1

  • 1Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA.

Journal of Synchrotron Radiation
|November 4, 2020
PubMed
Summary

Spatial filtering enhances X-ray beam coherence for improved focusing. This technique enables high-contrast speckle patterns essential for X-ray photon correlation spectroscopy (XPCS) experiments.

Keywords:
X-ray photon correlation spectroscopyrefractive lenses

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Area of Science:

  • X-ray optics
  • Coherent X-ray scattering
  • Synchrotron radiation

Background:

  • Achieving high coherence is crucial for advanced X-ray experiments like X-ray photon correlation spectroscopy (XPCS).
  • Diffraction-limited focusing is essential for resolving fine speckle patterns in scattering experiments.

Purpose of the Study:

  • To demonstrate a spatial filtering technique for enhancing horizontal coherence at an experimental station.
  • To achieve a diffraction-limited round focus using beryllium compound refractive lenses for XPCS.
  • To validate the optical layout and focusing performance with simulations and experimental data.

Main Methods:

  • Implementing spatial filtering with a horizontal slit near the X-ray source.
  • Utilizing beryllium compound refractive lenses for focusing.
  • Performing wave propagation simulations and hybrid ray-tracing calculations.
  • Conducting X-ray photon correlation spectroscopy experiments on an aerogel sample.

Main Results:

  • Enhanced horizontal coherence and a diffraction-limited round focus were achieved at 11 keV.
  • High-contrast speckle patterns with comparable horizontal and vertical speckle sizes were generated.
  • Focal spot sizes were consistent with theoretical calculations.
  • The method has been successfully implemented at the Advanced Photon Source (APS) 8-ID beamline since 2019.

Conclusions:

  • Spatial filtering is an effective method to improve X-ray beam coherence and focusing for XPCS.
  • The demonstrated technique provides a round, diffraction-limited focus suitable for high-visibility speckle pattern analysis.
  • This approach enhances experimental capabilities at synchrotron facilities by increasing coherent flux and improving resolution.