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Hard X-ray ptychography for optics characterization using a partially coherent synchrotron source.

Thomas E J Moxham1, Aaron Parsons1, Tunhe Zhou1

  • 1Diamond Light Source, Harwell Science and Innovation Campus, Didcot OX11 0DE, United Kingdom.

Journal of Synchrotron Radiation
|November 4, 2020
PubMed
Summary

This study demonstrates hard X-ray ptychography using partially coherent sources, enabling precise wavefront sensing and optical characterization. The technique accurately reconstructs the illumination probe for advanced imaging applications.

Keywords:
X-ray opticscompound refractive lensesptychographysynchrotronwavefrontzone-plate

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Area of Science:

  • Coherent X-ray imaging
  • Diffraction microscopy
  • Wavefront sensing

Background:

  • Ptychography is a scanning coherent diffraction imaging technique.
  • It provides high-resolution imaging and complete spatial information of the complex electric field probe and sample transmission function.
  • Its ability to accurately determine the illumination probe has led to its use at modern synchrotrons and free-electron lasers for optics alignment, monitoring, and correction.

Purpose of the Study:

  • To demonstrate a practical implementation of hard X-ray ptychography from a partially coherent X-ray source with a large number of modes.
  • To image a strongly diffracting Siemens star test sample using focused beams produced by a Fresnel zone plate or beryllium compound refractive lens.
  • To analyze the reconstructed probe to determine beam properties and quantify coherence.

Main Methods:

  • Experimental demonstration of hard X-ray ptychography with a partially coherent source.
  • Imaging a Siemens star test sample using Fresnel zone plate and beryllium compound refractive lens.
  • Back propagation of the recovered probe to plot beam caustic and determine focal size/position.
  • Analysis of reconstructed probe modes for coherence quantification.

Main Results:

  • Successful experimental demonstration of hard X-ray ptychography with a partially coherent source.
  • Accurate imaging of a Siemens star test sample.
  • Precise determination of focal size and position by back-propagating the recovered probe.
  • Quantification of beam coherence through power distribution of reconstructed probe modes.

Conclusions:

  • Hard X-ray ptychography can be practically implemented using partially coherent X-ray sources.
  • The technique allows for accurate characterization of optical elements and beam properties.
  • Modal decomposition in ptychography reconstruction relaxes the need for highly coherent sources, expanding its applicability.