Measuring material parameters using a tunable monochromatic terahertz wave source

We measured complex refractive indices of materials that transmitted well in the terahertz (THz) range using a tunable, monochromatic pulsed THz wave source and a high-sensitivity semiconductor detector. This approach is based on simple monochromatic transmission power measurements. Contrast enhancement by refractive index cladding was employed to measure the complex refractive indices. The experimental results were in good agreement with previously reported values. These results suggested that our approach could be used to quickly analyze material properties, such as surface roughness, and to determine the complex refractive indices of liquids or gases. In addition, as an application of the findings obtained here, we applied an anti-reflection polymer film to the silicon prism that served as an output coupler of the THz wave source. The film reduced surface reflection by 25%.