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    This study presents a new method for measuring complex refractive indices in the terahertz (THz) range using monochromatic transmission power. This technique enables rapid material analysis and optical property determination.

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    Area of Science:

    • Optics and Photonics
    • Materials Science
    • Terahertz Spectroscopy

    Background:

    • Accurate measurement of complex refractive indices is crucial for material characterization.
    • Existing methods can be complex or limited in scope.
    • Terahertz (THz) technology offers unique possibilities for non-destructive analysis.

    Purpose of the Study:

    • To develop a straightforward method for determining complex refractive indices in the THz range.
    • To demonstrate the applicability of the method for various materials, including liquids and gases.
    • To showcase a practical application by improving THz wave source efficiency.

    Main Methods:

    • Utilized a tunable, monochromatic pulsed THz wave source and a high-sensitivity semiconductor detector.
    • Employed simple monochromatic transmission power measurements.
    • Implemented contrast enhancement via refractive index cladding for precise measurements.

    Main Results:

    • Successfully measured complex refractive indices for materials with high THz transmission.
    • Experimental results showed excellent agreement with previously reported values.
    • Demonstrated potential for analyzing surface roughness and determining optical properties of liquids and gases.
    • Developed an anti-reflection polymer film reducing surface reflection by 25% for THz output couplers.

    Conclusions:

    • The developed method offers a rapid and effective approach for complex refractive index determination in the THz range.
    • This technique has broad implications for material science, quality control, and optical device development.
    • The anti-reflection film application highlights the practical utility of the research findings.