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Theoretical analysis of optically selective imaging in photoinduced force microscopy
Optics Express
|November 13, 2020
Summary
Photoinduced force microscopy (PiFM) offers enhanced sensitivity for studying composite molecular systems. This advanced technique reveals detailed molecular structures and electronic transitions, even forbidden ones, at high resolution.
Area of Science:
- Nanoscience
- Spectroscopy
- Materials Science
Background:
- Photoinduced Force Microscopy (PiFM) is a powerful technique for nanoscale imaging.
- Understanding the electric field interactions in composite molecular systems is crucial for advanced material characterization.
Purpose of the Study:
- To theoretically investigate the sensitivity and capabilities of PiFM for composite molecular systems.
- To explore the potential of PiFM for observing forbidden optical electronic transitions and resolving nanoscale features.
Main Methods:
- Utilized discrete dipole approximation to calculate the self-consistent response electric field.
- Modeled the PiFM tip, substrate, and composite molecules interactions.
- Investigated wavelength dependence of PiFM for dimer molecules.
Main Results:
- Demonstrated significantly higher PiFM sensitivity on resonant molecules due to localized electric field enhancement.
- Achieved high-resolution observation of forbidden optical electronic transitions in dimer molecules.
- Revealed drastic changes in PiFM images with incident light wavelength, correlating with electric field structures.
Conclusions:
- PiFM exhibits enhanced sensitivity beyond the traditional z^-4 dependence for resonant molecules.
- PiFM provides multifaceted information on nanomaterials by probing microscopic light-matter interactions.
- This study highlights PiFM's capability to resolve features beyond optical diffraction limits, including forbidden transitions.

