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Updated: Nov 30, 2025

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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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Modelling of Phase Contrast Imaging with X-ray Wavefront Sensor and Partial Coherence Beams
Ginevra Begani Provinciali1,2, Alessia Cedola2, Ombeline de La Rochefoucauld3
1LOA, ENSTA Paris, CNRS, Ecole Polytechnique IP Paris, 828 Boulevard des Maréchaux, 91120 Palaiseau, France.
Sensors (Basel, Switzerland)
|November 17, 2020
Summary
The Hartmann wavefront sensor precisely measures X-ray refractive index components. A new 3D wave propagation model enhances X-ray imaging simulations for diverse sources and coherence.
Area of Science:
- Physics
- Optics
- Materials Science
Background:
- The Hartmann wavefront sensor offers precise measurement of the real (δ) and imaginary (β) parts of the X-ray refractive index.
- Integrating the Hartmann sensor with tomographic setups enables direct material density measurements, expanding its applications in imaging.
Discussion:
- A novel 3D wave propagation model utilizing Fresnel propagation was developed to accurately simulate X-ray wavefront sensing experiments.
- This model accommodates varying degrees of source spatial coherence, crucial for experiments with tabletop sources, synchrotrons, and X-ray free-electron lasers.
- Physical description of beam divergence is incorporated, consistent with spatial coherence, for enhanced simulation fidelity.
Key Insights:
- The developed model accurately simulates experiments involving X-ray wavefront sensing across different coherence levels.
- High sensitivity of the Hartmann sensor to phase and absorption variations necessitates precise simulation tools for experimental optimization.
- The model supports accurate experimental design and parameter optimization for advanced X-ray imaging techniques.
Outlook:
- Further refinement of the 3D wave propagation model for complex sample geometries.
- Application of the model to optimize phase contrast imaging and quantitative phase tomography.
- Integration with advanced X-ray sources for novel material characterization techniques.
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