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Updated: Nov 30, 2025

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
Frédéric Mompiou1, Rui-Xun Xie2
1CEMES-CNRS and Université de Toulouse, Toulouse, France.
This study introduces new Transmission Electron Microscopy (TEM) tools for analyzing crystal defects like dislocations and grain boundaries. These user-friendly programs simplify microstructural characterization for material scientists.
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