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Updated: Nov 29, 2025

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Author Correction: Enhancing doping contrast and optimising quantification in the scanning electron microscope by

Augustus K W Chee1,2

  • 1Centre for Advanced Photonics and Electronics, Electrical Engineering Division, Department of Engineering, University of Cambridge, 9 JJ Thomson Avenue, Cambridge, CB3 0FA, United Kingdom. Augustus-Chee@cantab.net.

Scientific Reports
|November 18, 2020
PubMed
Summary

This study has a published amendment. Please refer to the link at the top of the paper for the updated information regarding the research findings.

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