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Field Emission Air-Channel Devices as a Voltage Adder
Wen-Teng Chang1, Ming-Chih Cheng1, Tsung-Ying Chuang1
1Department of Electrical Engineering, National University of Kaohsiung, Kaohsiung 811, Taiwan.
Field emission air-channel (FEAC) devices function at atmospheric pressure. This study demonstrates their arithmetic capabilities and reliability, showing potential for practical circuit applications despite some voltage decrease and increased leakage after testing.
Area of Science:
- Physics
- Electrical Engineering
- Materials Science
Background:
- Field emission air-channel (FEAC) devices operate at atmospheric pressure with low voltage.
- Symmetric electrodes in FEAC devices result in symmetric Fowler-Nordheim (F-N) plots.
- FEAC devices are practical components for electronic circuits.
Purpose of the Study:
- To demonstrate the arithmetic application of FEAC devices.
- To investigate the substrate effect on FEAC device performance.
- To evaluate the reliability of FEAC devices.
Main Methods:
- Constructed a voltage adder using two FEAC devices.
- Evaluated parasitic components and substrate effects on a dielectric film and silicon substrate.
- Performed finite element analysis to model electric fields and electron trajectories.
Main Results:
- FEAC devices exhibited arithmetic function, specifically as a voltage adder, though with reduced output voltage.
- Device impedance was frequency-dependent due to substrate effects.
- FEAC devices maintained voltage adder functionality after reliability testing, with increased current leakage.
- Finite element analysis confirmed optimal electric fields and electron paths at sharp apices, consistent with FEAC design principles.
Conclusions:
- FEAC devices show promise for arithmetic operations in circuits.
- Substrate properties significantly influence FEAC device impedance.
- FEAC devices demonstrate functional reliability, though performance degradation (increased leakage) is observed post-testing.
- Device design, particularly sharp apices, is critical for efficient field emission and tunneling current.
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