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Related Experiment Video

Updated: Nov 27, 2025

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

A constant-frequency feedback loop for non-contact frequency-modulated atomic force microscopy via root locus:

Solomon Davis¹, Tal Obstbaum¹, Gil Ben Ari¹

¹Department of Physics, Technion - Israel Institute of Technology, Haifa 3200003, Israel.

The Review of Scientific Instruments

|December 2, 2020

Summary

This summary is machine-generated.

This study introduces a new feedback loop for frequency modulated atomic force microscopy (FM-AFM) to improve imaging speed and reduce noise. The novel approach allows for easy tuning by adjusting a single parameter, enhancing AFM performance.

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Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

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Area of Science:

Surface Science
Nanotechnology
Microscopy

Background:

Frequency modulated atomic force microscopy (FM-AFM) commonly uses constant-frequency mode for surface height mapping.
The system's dynamics are described by a single transfer function, where bandwidth modification balances image noise and speed.
Existing methods face limitations in optimizing this trade-off for high-resolution, rapid imaging.

Purpose of the Study:

To develop a novel constant-frequency feedback loop for FM-AFM.
To enable tuning of the closed-loop bandwidth by adjusting a single parameter.
To improve the trade-off between imaging speed and noise in FM-AFM.

Main Methods:

Development of a new constant-frequency feedback loop incorporating self-excitation for cantilever resonance.
Utilizing root locus analysis to demonstrate control over closed-loop bandwidth via loop gain.
Experimental validation on a single-board field-programmable gate array (FPGA) device.

Main Results:

A robust, low-order, real-poled feedback loop was designed.
The loop gain was identified as the sole parameter for modifying closed-loop bandwidth.
Experimental validation confirmed the effectiveness of the proposed methodology.

Conclusions:

The developed feedback loop offers a simplified and effective method for tuning FM-AFM parameters.
This approach enhances imaging speed and reduces noise without compromising resolution.
The methodology is practical and validated for real-world AFM applications.