A Novel Counterfeit Feature Extraction Technique for Exposing Face-Swap Images Based on Deep Learning and Error Level

Weiguo Zhang1, Chenggang Zhao1, Yuxing Li2

  • 1College of Computer Science and Technology, Xi'an University of Science and Technology, Xi'an 710054, China.

Summary

This study introduces a new method using deep learning and error level analysis (ELA) to detect DeepFake images. The technique efficiently identifies counterfeit traces caused by differing compression ratios, improving detection accuracy and reducing computational cost.