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Updated: Nov 26, 2025

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Amir Jangizehi1, Friederike Schmid, Pol Besenius
1Johannes Gutenberg University Mainz, Department of Chemistry, Duesbergweg 10-14, D-55128 Mainz, Germany.
Defect engineering, rarely used in soft matter, offers a promising approach to control material properties. This review surveys its application across nine soft matter classes, highlighting its potential for tailored material design.
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