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Certification of Standard Reference Material 660c for powder diffraction.

David R Black¹, Marcus H Mendenhall¹, Craig M Brown²

¹Materials Measurement Science Division of Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.

Powder Diffraction

|December 14, 2020

Summary

This summary is machine-generated.

The National Institute of Standards and Technology (NIST) introduces Standard Reference Material (SRM) 660c, a lanthanum hexaboride (LaB₆) powder for calibrating X-ray and neutron powder diffractometers. This material precisely determines instrument profile functions and lattice parameters.

Keywords:

Standard Reference Material X-ray diffraction certification diffractometer lattice parameter

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Area of Science:

Materials Science
Crystallography
Metrology

Background:

Standard Reference Materials (SRMs) are crucial for instrument calibration.
Powder diffractometers require accurate calibration for lattice parameter and line shape determination.
Previous generations of SRMs have been developed for X-ray diffraction.

Purpose of the Study:

To describe the fourth-generation powder diffraction SRM, SRM 660c.
To provide a reliable standard for calibrating powder diffractometers for both X-ray and neutron diffraction.
To certify the lattice parameter of lanthanum hexaboride (LaB₆) powder.

Main Methods:

SRM 660c was prepared using isotopically enriched 11B precursor for neutron diffraction applicability.
The LaB₆ powder's microstructure was engineered to minimize size and strain broadening.
A specialized NIST-built diffractometer was used for certification, incorporating advanced design features.

Main Results:

SRM 660c is certified for lattice parameter determination.
The certified lattice parameter for LaB₆ at 22.5 °C is a = 0.415 682 6 ± 0.000 008 nm (95% confidence).
Both Type A and Type B uncertainties were rigorously assigned.

Conclusions:

SRM 660c is a highly accurate standard for powder diffractometer calibration.
This new SRM enhances the capabilities for both X-ray and neutron diffraction analysis.
The precise lattice parameter certification ensures reliable instrument performance evaluation.