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A simple method to clean ligand contamination on TEM grids.

Chen Li1, Adrian Pedrazo Tardajos1, Da Wang1

  • 1Electron microscopy for Materials research (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerpen, Belgium.

Ultramicroscopy
|December 21, 2020
PubMed
Summary
This summary is machine-generated.

This study introduces a simple method using activated carbon and ethanol to clean colloidal nanoparticles (NPs) on transmission electron microscopy (TEM) grids. This cleaning process effectively reduces carbon contamination, significantly improving image quality for nanomaterial analysis.

Keywords:
Colloidal nanoparticlesContaminationLigandsTEM

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Area of Science:

  • Materials Science
  • Nanotechnology
  • Electron Microscopy

Background:

  • Colloidal nanoparticles (NPs) synthesized chemically often possess organic ligands.
  • These ligands cause significant carbon contamination during transmission electron microscopy (TEM) analysis due to electron beam-induced deposition.
  • Contamination is particularly severe in scanning TEM (STEM) owing to higher electron dose rates.

Purpose of the Study:

  • To develop a straightforward and efficient method for cleaning TEM grids with ligand-coated NPs.
  • To mitigate electron beam-induced carbon contamination in TEM imaging of nanomaterials.
  • To enhance the quality of electron microscopy images and analytical measurements.

Main Methods:

  • Utilizing a combination of activated carbon and ethanol for cleaning TEM grids.
  • Applying the cleaning method to drop-cast TEM grids containing NPs with organic ligands.
  • Evaluating the reduction of ligands and subsequent improvement in image quality.

Main Results:

  • The activated carbon and ethanol treatment effectively reduces the amount of organic ligands on TEM grids.
  • A significant decrease in electron beam-induced carbon contamination was observed.
  • The quality of TEM images and the reliability of subsequent analytical measurements were greatly improved.

Conclusions:

  • The developed method provides an efficient and facile way to clean ligand-coated NPs on TEM grids.
  • This technique is broadly applicable to various nanomaterials susceptible to ligand-induced contamination.
  • Improved sample preparation enhances the investigation of nanomaterial structures and properties via electron microscopy.